Digital Test Equipment Glossary H-R
Intensity Grading – Frequency-of-occurrence information that is
essential to understanding what the waveform is really doing.
Interpolation – A processing technique to estimate
what a fast waveform looks like based on only a few sampled points.
Loading – The interaction of the probe and test equipment with
the circuit being tested which distorts a signal.
Peak Detection – An acquisition mode that enables you to observe signal details that may otherwise be missed, particularly useful for seeing narrow pulses spaced far apart in time.
Peak-to-peak (Vp-p) – The voltage measured from the maximum point of a
signal to its minimum point.
Period – The amount of time it takes a wave to complete one cycle.
The period equals 1/frequency.
Phase – The amount of time that passes from the beginning of a cycle to
the beginning of the next cycle, measured in degrees.
Phase Shift – The difference in timing between two otherwise
similar signals.
Pre-trigger View – The ability to capture
what a signal did before a trigger event. Determines the length of
viewable signal both preceding and following a trigger point.
Probe – An input device for making electrical contact with a circuit, a lead to connect to the circuit’s ground reference, and a cable for transmitting the signal and ground to the test equipment.
Pulse – A common waveform shape that has a fast rising edge, a width,
and a fast falling edge.
Pulse Width – The amount of time the pulse takes to go from low to high
and back to low again, conventionally measured at 50% of full voltage.
Ramp – Transition between voltage levels of sine waves that change at
a constant rate.
Real-time Sampling – A sampling mode in which
as many samples for collected as possible from a triggered acquisition.
Ideal for signals whose frequency range is less than half the analyzer’s
maximum sample rate.
Rise Time – The time taken for the leading edge of a pulse to rise from its
low to its high values, typically measured from 10% to 90%.
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